Measures the mean-time-between failures


Discussion:

Q: A manufacturer produces a batch of memory chips (RAM) and measures the mean-time-between failures (MTBF). the manufacturer then changes a manufacturing process and produces another batch and again measures the MTBF. Did the change to the process improve the MTBF?

How do I determine if this is parametric or nonparametric?

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Basic Statistics: Measures the mean-time-between failures
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