Homework:
In order to expedite product development, 24 electronic parts, which are designed to operate at field temperature up to 40oC have been subjected to accelerated testing. The first group of eight samples have been tested at 60oC (333K), second group at 80OC (353K) and third group at 100OC. The test was terminated after 250hrs. The time to failure data are shown on the table below. Determine 1. The life-stress relationship for this device and 2. The reliability after 100hrs of operation at field temperature.
1. One MS Word file with answers and graphs
2. Minitab file:
A. Data (worksheet)
B. Weibull plots and parameters
3. Life-stress relation file (excel, matlab..etc)