A scanning electron microscope is employed to look at cell structure having 10-nm resolution. A beam of electrons from a hot filament is accelerated having a voltage of 15 kV and then focused to a small spot on the specimen.
(i) Determine the wavelength in nanometers of the beam of incoming electrons?
(ii) When the size of the focal spot was determined just by diffraction, and when the diameter of the electron lens is one fifth the distance from the lens to the specimen, determine what would be the minimum separation resolvable on the specimen?