How would multiple scan chains affect our maximum test


A design contains 325 flip-flops. Assuming we use a full-scan design methodology with a single scan chain, how many flip-flops would be in the scan chain? If we exercise the scan clock at 10 MHz, how fast can we supply arbitrary parallel test vectors to the DUT circuits under test? How would multiple scan chains affect our maximum test vector rate?

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Electrical Engineering: How would multiple scan chains affect our maximum test
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