1) Describe how test points can be utilized to increase the controllability and observability with appropriate examples.
2) Write brief notes on structural testing and Functional testing.
3) Describe the terms Fault collapsing and Fault dominance.
4) What do you understand cycle free circuit? Describe in detail.
5) Describe the use of linear feedback shift register in test pattern generation for BIST in detail.
6) Write down the reduced functional faults which can occur in the memory and describe any two of them.
7) Describe with appropriate examples any four Adhoc designs for testability techniques.
8) Describe the boundary scan architecture in detail.