Each test of an integrated circuit produces an acceptable, Basic Statistics

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Each test of an integrated circuit produces an acceptable

Each test of an integrated circuit produces an acceptable circuit with probability p, independent of the outcome of the test of any other circuit. In testing n circuits, let K denote the number of circuits rejected and let X denote the number of acceptable circuits (either 0 or 1) in the last test. Find the joint PMF PK,X (k, x).

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Basic Statistics: Each test of an integrated circuit produces an acceptable

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