Characteristics with use of scan designs
Explain the characteristics associated with the use of scan designs?
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Some of the attributes that are associated with the use of scan designs are following:
a) Flip-flops and latches are more complex. Hence, scan designs are expensive in terms of board or the silicon area.
b) One or more additional I/O is required.
c) Test generation costs may be appreciably decreased. This can also lead to the higher fault coverage.
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