Characteristics with use of scan designs

Explain the characteristics associated with the use of scan designs?




Some of the attributes that are associated with the use of scan designs are following:

a) Flip-flops and latches are more complex. Hence, scan designs are expensive in terms of board or the silicon area.

b) One or more additional I/O is required.

c) Test generation costs may be appreciably decreased. This can also lead to the higher fault coverage.

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